Scanning Electron Microscopy



 

Equipment:

Hitachi 3600N Variable Pressure Scanning Electron Microscope
 Hitachi 3400N Variable Pressure Scanning Electron Microscope
Normal Secondary Imaging (Low Voltage to 30 kv)
Large Specimen Stage (6 in. Diameter Specimen)
Environmental Chamber (Imaging of Uncoated Nonmetallics and
Liquids to 30 kv)



  Application: 

Microscopic Imaging and Photodocumentation from 15x to 100,000x
Fracture Imaging and Photodocumentation from 15x to 100,000x
Fiber/ Particle Examination
Lubricant/ Wear Particle Examnation